Lamella
(FIB-SEM)

Lamella preparation using focused ion beam scanning electron microscopy (FIB-SEM) is a precise technique for creating ultra-thin sections of samples, typically for downstream imaging in cryo-electron tomography (cryo-ET). This method uses a focused ion beam to carefully mill a vitrified sample, isolating a region of interest into a lamella thin enough for high-resolution electron beam imaging. The process preserves the native state of the sample while providing access to specific intracellular or structural features. Facilities offering FIB-SEM lamella preparation handle all steps, including sample mounting, site targeting, milling, and quality control to ensure optimal results.

For academic labs and industry clients, this service delivers ready-to-image lamellae, enabling detailed structural studies at molecular resolution, particularly for challenging samples like cells or tissues embedded in ice.