Slice and View
(FIB-SEM)

Slice-and-view focused ion beam scanning electron microscopy (FIB-SEM) is an advanced technique that enables high-resolution 3D imaging of biological and material samples. The process involves using a focused ion beam to mill ultra-thin layers from the sample while capturing sequential 2D images with a scanning electron microscope (SEM). These images are then reconstructed into a detailed 3D model, revealing nanoscale structural information.

This service is ideal for researchers who need to visualize the internal architecture of complex samples. Facilities offering slice-and-view FIB-SEM services manage all aspects of the workflow, including sample preparation, milling, imaging, and 3D reconstruction. Whether you’re in academia or industry, this service provides precise, high-quality 3D datasets that are invaluable for understanding structural relationships in biological tissues, materials science, and nanotechnology applications.